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Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a very high-resolution type of Scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

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  • Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a very high-resolution type of Scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
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